SnLayer
High-Precision Coating Thickness Measurement on Metals
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Product description
When coating metals, even the thinnest layers can achieve the desired functional effect. However, these layers must be applied uniformly to ensure optimal electrical performance and long-term stability. Any excess coating not only wastes valuable materials but also significantly increases costs.
The SnLAYER analysis system from ECH offers a fast and highly accurate solution for determining coating thickness on metallic surfaces – all with a single measurement.
Innovative Electrochemical Technology
SnLAYER is based on a newly developed electrochemical method using coulometric voltammetry, fully aligned with DIN 1787 and DIN 40500, Part 5.
The patented potential scan method enables the simultaneous detection of both free and alloyed portions of the coating – for example, tin layers on copper substrates.
Fast, Reliable Results
A typical analysis takes less than five minutes, delivering precise results that help optimize material usage, ensure quality, and reduce costs in production processes.
Applications
Measurement of tin layer thickness on copper wires, copper sheets, wire strands
Determination of alloyed and unalloyed tin
Analysis of nickel, silver, copper and alloys on copper, steel, Percon and others
Conductor board manufacture
Wire and cable manufacture
Applications in the metalworking industry
SnLAYER for determination of thickness of metal layers
Advantages
Complete measurement system for determination of the layer thickness of metal coatings
Differentiation of free and bounded tin
Fast analysis
Customer-friendly handling
Intuitive software
Comprehensive statistic module
Wide dynamic range for various wire-diameters and layer thickness
Universally applicable for different types of layers
Features and Results
Typical duration: 8 min (non-alloyed and alloyed tin), < 2 min (non-alloyed tin)
High precision of the analysis
Currency will be registered in the provided potential range, freely adjustable in a range from - 2000 mV to + 2000 mV, e. g. - 600 mV up to + 300 mV
Pre-defined methods specified for certain wire types
Generation of individual methods
Determination of the mass of the coating by integration of the current (amount of electric charge)
Automatic procedures
Determination of the thickness with only one measurement with high precision in a short duration
According to the actual standard regulations
Coulometric measuring cell - the sample is the working electrode
Software requirements
Operating system | Windows 10 or higher |
Platform | 32 Bit (x86) |
CPU | 1 Ghz |
RAM | 1 GB |
HDD / SSD | 17 GB |
GPU | DirectX 9 with WDDM 1.0 |
Available languages | German, English |
Number of connections | 1 |
Data connection | USB-B to USB-A |
Typical measurement - automatic peak analysis / interpretation
Technical specifications
Device Type | Main unit |
Power supply | 230 V/50 Hz or 110 V/60 Hz |
Power Input | 150 W |
Dimensions (W x H x D) | 370 x 345 x 160 mm |
Weight | 6 kg |
Data connection | USB-B |
Device control | PC Software |
| Working electrode | Wire or strip sample to be examined |
| Reference electrode | Ag/AgCl adapted to the application |
| Counter electrode | Pt |
| Typical duration | 2 ... 8 min (depending on the layer thickness) |
| Typical wire diameters | 0.05 ... 8 mm |
| Typical layer thicknesses | 0.01 ... 22 µm |